The April Edition of the OSSC
Images Newsletter in now available!!!
OSSC Election of Officers
Congratulations New Officers!!
President: Nicholas Croglio Jr.
Vice President: Charles Gaugh
Secretary: Michelle Langland
Treasurer: Mathew Samson
Councilors: Graham Brewis, Justin Francis, & Russell Rauch
The OSSC also thanks Councilor candidates Michael Gordon, Stan Klyza & Richie Nagi for offering to serve in an appointed leadership role for the upcoming 2018-2019 active period.
The OSSC would love for you to join our leadership team. Planning for the next active period begins soon. If you would like to help, please contact OSSC President Nicholas Croglio.
OSSC Annual Report
Congratulations for a great 2017 - 2018 Program Year!!
Please Download the 2017 - 2018 OSSC Annual Report for an overview of our great program year!
Thank you to all of the members on making this such a great year for the OSSC!!!
Fall 2018 courses begin in early October:
15% discount for OSSC Members on courses
Required for a Certificate.
(Discount does NOT apply to the above two
Electives and Prerequisite Courses.)
Laser and Photonics Technology instructors lead hands-on, laboratory-driven classes, utilizing state-of-the-art industrial equipment, based on the industry-guided photonics curricula written by industry professionals. In addition to laboratory skills, students are offered one-on-one support and career advice, including résumé and LinkedIn profile building.
Recent Outreach Event
STEM & The Arts Career Showcase
Thanks to everyone who helped!!
The STEM & the Arts Career Showcase is an annual three-day event held at the OC Fair and Event Center that gives students the opportunity to explore career pathways in STEM fields. The program brings together industry professionals, educators, and college representatives that provide students the opportunity to explore their future. The program includes student competitions and displays, industry demonstrations, career exploration exhibits, industry speakers, a job recruitment area, live entertainment, and more! The program reaches over 6,000 targeted students, parents and their families.
Thanks Justin Francis, Bo Wang & Donn Silberman for organizing and volunteering at the event.
New OSSC Fellows & LTA
Congratulations New Fellows
Lifetime Achievement Awardee
Al Hatheway receiving his OSSC Lifetime Achievement Award with friends Tom Godfrey, Arnie Bazensky and OSSC President Bo Wang
Recent OSSC Meetings
13 June 2018
Annual Business Meeting
Applications of Short Coherence Sources in Fizeau Interferometry
Dr. Michael North Morris,
Senior Director of Product Development,
Abstract: Most Fizeau interferometers use laser sources with many meters of coherence to ensure high contrast fringes are produced regardless of the position of the test article. The independence of the fringe contrast from test part position is admittedly very convenient. However, using a short coherence source with internal path matching opens up applications that are not possible with the longer coherence source. These applications include isolating the surfaces when measuring plane parallel optics, facilitating test and reference beam separation for vibration immune interferometry, and streamlining radius of curvature measurements by moving the position detection internal to the interferometer. This presentation will cover the theory behind each of the applications and present practical results from commercial implementations. Of particular interest will be the surface isolation as applied to a large 24-inch aperture interferometer and radius of curvature measurements in a production environment.
Challenges and Opportunities in Asphere and Freeform Metrology
Dr. Brent Bergner
Abstract: Aspheric and freeform surfaces can be a useful addition to the optical designer’s toolbox. The additional degrees of freedom allow for a reduction in the number of surfaces, making systems lighter, cheaper, and more compact. New technologies such as MRF, slow tool servo diamond turning, and optimized molding and replication techniques have expanded the range of their practical applications. However, aspheric and freeform surfaces can still be difficult and expensive to measure. In this presentation, we survey the various methods for measuring these surfaces and examine some of the sources of error, limitations, and other gothchas for each of the techniques. With that prospective we then look at recent advances and potential paths forward for improving the accuracy, speed, and flexibility of aspheric and freeform metrology.